Formation of Metaloorganic Multilayer Structures by Langmuir-Blodgett Technique

Authors

  • Irina ČERNIUKĖ∗, Sigitas TAMULEVIČIUS, Igoris PROSYČEVAS, Judita PUIŠO, Asta GUOBIENĖ, Mindaugas ANDRULEVIČIUS Kaunas University of Technology

Keywords:

Langmuir-Blodgett technique, Langmuir-Blodgett mono- and multilayer, AFM, XPS, ellipsometry.

Abstract

The preliminary results on the formation of Langmuir-Blodgett (LB) multilayers and following sulphidization are
presented. Well-known techniques to visualise the morphology, assess optical characteristics, thickness and chemical
composition of mono- and multilayers on different substrates (atomic force microscopy, ellipsometry and X-ray
photoelectron spectroscopy) were used to analyze produced multilayer structures. It is shown that roughness of the
produced metallorganic layers containing Ni and Cu depends on the roughness of the substrate (Si, PET, SiO2), number
of layers as well as on the following sulphidization procedure.

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Published

2006-12-08

Issue

Vol. 12 No. 4 (2006)

Section

ELECTRONIC AND OPTICAL MATERIALS

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