Kinetic Analysis of Relaxation Electron Emission: Exotic Cases of the Energy Transfer

Authors

  • L. Oster∗, J. Haddad Negev Academic College of Engineering NACE

Keywords:

Exoelectron emission, Auger-recombination, radical-recombination, surface electric field, solids.

Abstract

The kinetic theories of non-stationary and non-equilibrium Auger-emission, ion-recombination electron emission, emission stimulated by surface electric fields, radical-recombination electron emission and their influence on stationary electron emission that have been developed are capable of explaining most of the important features of the relaxation electron emission. Thus, it is shown, that both Auger luminescence and exoemission have a similar dependence on time and temperature. The rate of emission decay is defined by the depth of the trapping centers, responsible for recombination. Ion-Recombination emission from the opposite side of the sample has time delay and lower maximum intensity, in comparison with that from the side exposed to radiation, as predicted by the theory developed in this study. Tunnel electron ejection is expected for thin insulator films during emission stimulated by the surface electric field. Different types of energy transfer from recombined radicals to electron trapping centers and the role of relaxation process in stationary emission are also discussed.

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Published

2003-09-21

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Section

Articles