Scanning Nondestructive Material Homogeneity Mapping Technique

Authors

  • A. Laurinavičius∗, T. Anbinderis, Yu. Prishutov, O. Martianova Semiconductor Physics Institute

Keywords:

material homogeneity, millimeter waves.

Abstract

Millimeter wave bridge technique for non-destructive material homogeneity mapping is described. The concept of this technique is the local excitation of millimeter waves in testing material and the measurement of the transmitted (reflected) signal’s amplitude and phase in it different places. Some results of the homogeneity measurements for the dielectric substrates, metallic surfaces and biological objects are also presented.

Downloads

Published

2003-12-10

Issue

Vol. 9 No. 4 (2003)

Section

Articles

License

 

The copyrights for articles in this journal are retained by the author(s), with first publication rights granted to the journal. By virtue of their appearance in this open-access journal, articles are free to use with proper attribution in educational and other non-commercial settings.